Overview
Project No. | 417 |
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Contract No. | DTRT57-11-C-10022 |
Research Award Recipient | Intelligent Optical Systems, Inc. (IOS) 2520 West 237th Street Torrance CA 90505-5217 Torrance, CA 90505 |
AOTR | James Merritt |
Researcher Contact Info | Dr. Marvin Klein MKlein@intopsys.com |
Project Status | Closed |
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Start Fiscal Year | 2011 (06/30/2011) |
End Fiscal Year | 2012 (12/31/2011) |
PHMSA $$ Budgeted | $149,999.00 |
Main Objective
Intelligent Optical Systems (IOS) will develop a unique structured light-based pipe profiling tool that can be used to comprehensively map and characterize pipeline damage. IOS will engage Blade Energy Partners to objectively compare the new IOS profiling technology with a profiling tool recently evaluated by Blade for Pipeline Research Council International (PRCI). IOS will generate advanced image processing software and apply it to data from both tools to enhance their usefulness for comprehensive damage assessment. Finally, IOS will test our profiling tool on a set of damaged samples provided by PRCI. Blade will process the data to calculate the strain field, and these results will be compared with the results of testing on the same samples using a 3-D laser profiling tool.
Public Abstract
Mechanical damage (typically from third party excavations) is the most frequent cause of leaks and ruptures in pipelines. Surface corrosion is also a threat to pipeline integrity. Currently used techniques for assessing damage by means of in-line inspection and in-ditch tools are not accurate enough for reliable determination of fitness for service. In this project, Intelligent Optical Systems will determine the feasibility of implementing a novel surface-profiling tool for mechanical damage evaluation based on the real-time processing of a single digital image.
This inexpensive, full-field system images the full shape of the damaged region with high accuracy, and overcomes current limitations in the assessment process. In Phase I, IOS will demonstrate the capability to produce surface profiles with the required spatial and depth resolution. IOS will perform measurements on test samples, and compare the data with related data obtained with more complex laser-based tools.
Relevant Files & Links
Other Files
Technical Brief of research project
Kick off meeting presentation